SimYog Webinar: From BCI Failure to Root Cause: Using Simulation to See What the Lab Can’t

Bulk Current Injection (BCI) failures can be difficult to diagnose when conventional filtering does not solve the problem. In this webinar, we examine a real automotive inductive position sensor that consistently failed ISO 11452-4 BCI testing between 20 and 30 MHz.

Using Compliance-Scope, the complete BCI test environment was recreated virtually to trace how common-mode noise traveled through the cable harness, PCB, and sensor winding structure before appearing as differential-mode voltage at sensitive IC pins. The analysis revealed that parasitic coupling and resonance within the sensor’s secondary winding filter network—not the expected power or signal paths—were driving the failure.

Attendees will see how simulation, sensitivity analysis, and What-If analysis were used to identify the dominant components, evaluate alternative filter configurations, and select a mitigation before modifying hardware. The simulated failure range of 19–27 MHz closely matched the 20–30 MHz failure measured in the lab, with the final hardware test confirming the simulated solution.

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What You’ll Learn

• How common-mode BCI noise can become differential-mode voltage at sensitive IC pins
• How to recreate an ISO 11452-4 BCI test environment in simulation
• How to identify hidden coupling paths and resonant structures driving immunity failures
• How sensitivity analysis can identify the components having the greatest impact on EMC performance
• How What-If analysis can evaluate filter changes before modifying hardware
• How simulation-to-measurement correlation supports predictive BCI debugging

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Webinar Agenda (60 minutes)

• Introduction and ISO 11452-4 BCI testing
• Understanding common-mode to differential-mode noise conversion
• Recreating the BCI test environment in Compliance-Scope
• Identifying the hidden coupling path and resonant failure mechanism
• Sensitivity analysis and filter optimization
• Simulation-to-measurement correlation and hardware validation
• Live Q&A

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Who This Is For

Hardware Design Teams: Hardware Engineers, EMC Engineers, Design Verification Engineers, and System Engineers working on automotive electronics and BCI immunity challenges.

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Why Attend

• Understand why conventional filtering may fail to solve BCI immunity problems
• Learn how to trace noise from the injected current to sensitive IC pins
• See how simulation can reveal coupling mechanisms that are difficult to observe in the physical lab
• Learn how to evaluate mitigation strategies before modifying hardware or repeating lab tests

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Presenter

Vasanthi T. L., Applications Engineer, SimYog Technology

Vasanthi is an Application Engineer within the Models Team at Simyog Technology, where she works on simulation models for EMC applications. A 2024 M.Tech. graduate from IIT Kharagpur’s Department of Electronics and Electrical Communication Engineering, her technical interests lie in Electromagnetics and RF Engineering.

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